The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Jun. 02, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Taihei Mukaide, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2018.01); G01N 23/046 (2018.01); G01N 23/207 (2018.01);
U.S. Cl.
CPC ...
G01N 23/083 (2013.01); G01N 23/046 (2013.01); G01N 23/207 (2013.01); G01N 2223/304 (2013.01); G01N 2223/419 (2013.01);
Abstract

Provided is a method for acquiring information relating to a composition of a detected object from results of a measurement, using radiation, this method including: a step for acquiring by a computer a result of measuring the detected object using radiation; a step for estimating by a computer a chemical composition ratio of the detected object, using an equation that contains a value derived from the measurement result as a constant and contains a value derived from the chemical composition ratio of the detected object as a variable, and then solving the equation; and a step for outputting the estimated chemical composition ratio or a physical property value acquired based on the estimated chemical composition ratio as information relating to the composition of the detected object.


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