The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Jun. 24, 2015
Valmet Automation Oy, Espoo, FI;
Markku Mäntylä, Kangasala, FI;
Pekka Suopajärvi, Oulu, FI;
Jussi Tenhunen, Oulu, FI;
Janne Paaso, Tyrnävä, FI;
VALMET AUTOMATION OY, Espoo, FI;
Abstract
Optical multi-channel measurement unit for a process measurement includes first ends for receiving optical radiation from the optical radiation source, and second ends for outputting the optical radiation for illuminating the at least one object. Optical detectors receive optical radiation from at least one measurement channel via at least one optical filter and convert an intensity of the optical radiation to an electrical signal. A movement mechanism causes, for filtering the wavelengths of the optical radiation propagating between detectors and the optical measurement channels through the optical filters, at least one of the following: movement inside at least one optical filter and movement between the filters and the detectors.