The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Oct. 31, 2017
Applicant:

Republic of Korea (National Forensic Service Director Ministry of Public Administration and Security), Seoul, KR;

Inventors:

Young Il Seo, Wonju-si, KR;

Eun Bi Lee, Seoul, KR;

Sang Yoon Lee, Siheung-si, KR;

Eun Ah Joo, Yongin-si, KR;

Dong A Lim, Yuseong-gu, KR;

Jin Pyo Kim, Yuseong-gu, KR;

Nam Kyu Park, Bucheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/01 (2006.01); G06T 7/60 (2017.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/01 (2013.01); G06T 7/0012 (2013.01); G06T 7/60 (2013.01); G01N 2021/0112 (2013.01);
Abstract

Provided is a method of discriminating between bloodstains, the method including obtaining a captured image of an analysis target; analyzing the captured image and extracting a scattering image of a plurality of bloodstains in the analysis target; estimating a scattering angle of the scattering image; and determining the plurality of bloodstains to be an impact spatter bloodstain if the scattering angle is greater than a preset reference angle, and determining the plurality of bloodstains to be a cessation cast-off bloodstain if the scattering angle is less than the reference angle.


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