The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Mar. 04, 2016
Applicant:
National Institute for Materials Science, Ibaraki, JP;
Inventors:
Genki Yoshikawa, Ibaraki, JP;
Kota Shiba, Ibaraki, JP;
Assignee:
NATIONAL INSTITUTE FOR MATERIALS SCIENCE, Ibaraki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/00 (2006.01); G01N 5/02 (2006.01); G01N 29/02 (2006.01); G01N 29/36 (2006.01); G01N 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 9/00 (2013.01); G01N 5/02 (2013.01); G01N 9/002 (2013.01); G01N 11/00 (2013.01); G01N 29/022 (2013.01); G01N 29/36 (2013.01); G01N 2291/0427 (2013.01);
Abstract
A sample in a gas state to be measured is forced to impinge on a structure in which a change in a characteristic including a mechanical deformation, an optical change, an electric change and a magnetic change is exerted due to the impingement of a gaseous sample, a gasified liquid sample or solid sample to cause at least one of changes in characteristics including a mechanical deformation, an optical change, an electric change and a magnetic change; and the molecular weight of the sample in a gas state is obtained.