The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
May. 26, 2015
Johannes Izak Boerhout, San Diego, CA (US);
Johannes Izak Boerhout, San Diego, CA (US);
Aktiebolaget SKF, Göteborg, SE;
Abstract
A method for determining whether a defect exists in a machine. The method includes receiving a signal from a sensor that includes data related to operation of a machine. It is determined whether the data in the signal is accurate or valid and a first input is generated therefrom. It is determined whether a defect exists in the machine by analyzing the data in the signal and a second input is generated therefrom. The first input and the second input are introduced into one or more logic gates, which generate an output that indicates whether the defect exists in the machine. A user is notified when the output indicates that the defect exists in the machine.