The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Mar. 22, 2019
Applicant:
Fujitsu Component Limited, Tokyo, JP;
Inventors:
Satoshi Moriyama, Tokyo, JP;
Osamu Daikuhara, Tokyo, JP;
Assignee:
FUJITSU COMPONENT LIMITED, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01); G02B 6/30 (2006.01); G01M 11/08 (2006.01); G02B 6/42 (2006.01); G02B 6/38 (2006.01);
U.S. Cl.
CPC ...
G01M 11/33 (2013.01); G01M 11/088 (2013.01); G01M 11/30 (2013.01); G02B 6/30 (2013.01); G02B 6/385 (2013.01); G02B 6/4225 (2013.01);
Abstract
A testing method for testing a jointed condition of a first ferrule holding an edge of an optical waveguide and a second ferrule holding an edge of an optical fiber, includes: dipping the first ferrule and the second ferrule that are jointed to each other into coolant so that the optical waveguide and the optical fiber are optically connected; heating the coolant; cooling the coolant after the heating; inputting a light to one of the optical waveguide and the optical fiber after cooling the coolant, and detecting a light output from the other.