The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Dec. 01, 2017
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Andrew D. Shiner, Ottawa, CA;

Michael Andrew Reimer, Stittsville, CA;

Maurice O'Sullivan, Ottawa, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/33 (2013.01);
Abstract

Methods and assemblies for determining a property or environment of an optical fiber, including: measuring a frequency dependent electrostrictive response of an optical fiber; and based on the measured frequency dependent electrostrictive response, determining a property of the optical fiber. The property or environment of the optical fiber includes one or more of optical fiber type, optical fiber material type, optical fiber material property, optical fiber area, optical fiber geometry, optical fiber condition, optical fiber stress and strain, optical fiber environment, optical fiber temperature, optical fiber routing, optical fiber spooling, and optical fiber radiation exposure.


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