The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

May. 26, 2016
Applicant:

Board of Trustees of Michigan State University, East Lansing, MI (US);

Inventors:

Marcos Dantus, Okemos, MI (US);

Gary J. Blanchard, Okemos, MI (US);

D. J. Osborn, III, Adelaide, AU;

Elan Dantus, Okemos, MI (US);

Sheryl Blanchard, Okemos, MI (US);

Evan Blanchard, Okemos, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 5/00 (2006.01); A61B 5/0476 (2006.01);
U.S. Cl.
CPC ...
G01L 5/0052 (2013.01); A61B 5/0476 (2013.01);
Abstract

The disclosure relates to materials and articles that provide an irreversible history of compression forces and torques experienced by the materials and articles. The disclosure relates more particularly to an multiple impact level detection assembly as well as related articles and methods. The multiple impact level detection assembly provides distinct impact patterns depending on the impact force and direction (for torqueing motions) received by the detection assembly. The detection assembly can be incorporated into a variety of articles and used in a variety of settings, for example to monitor personal safety in a protective garment such as a helmet. The detection assembly incorporates an impact detection medium (e.g., a plurality of microcapsules with an indicator therein), which can serve as an irreversible means for detecting impact on the assembly via a relief substrate incorporated into the assembly.


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