The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Jun. 07, 2016
University of Rochester, Rochester, NY (US);
Jannick P. Rolland, Pittsford, NY (US);
Jacob Reimers, Homestead, FL (US);
University of Rochester, Rochester, NY (US);
Abstract
Expanded performance opportunities for imaging spectrometers are described using ϕ-polynomial freeform surfaces in reflective and diffractive optics. The imaging spectrometers are generally of a type that include an entrance aperture for admitting radiation over a range of wavelengths, a detector array, a primary reflective optic with optical power, a secondary reflective diffractive optic, and a tertiary reflective optic with optical power for collectively imaging the entrance aperture onto the detector array through a range of dispersed positions. One or more of the primary reflective optic, the secondary reflective diffractive optic, and the tertiary reflective optic can include a ϕ-polynomial optical surface with no axis of symmetry and represented by a function that depends on both a radial component and an azimuthal component.