The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Nov. 01, 2010
Applicant:
Paul James Scott, Leicester, GB;
Inventor:
Paul James Scott, Leicester, GB;
Assignee:
TAYLOR HOBSON LIMITED, Leicester, Leicestershire, GB;
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01B 5/20 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01B 5/20 (2013.01); G01M 11/025 (2013.01);
Abstract
A method of characterizing the surface of an aspheric diffractive structure includes using a metrological apparatus to perform a measurement on the surface of the structure so as to provide a measurement profile representing the z-direction deviations of the surface of the structure; determining parameters relating to the aspheric and diffractive components of the aspheric diffractive structure; producing data having the determined parameters; and comparing the produced data with the measurement profile to determine residual error data.