The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Nov. 23, 2016
Nalux Co., Ltd., Osaka-shi, Osaka, JP;
Daisuke Seki, Osaka, JP;
Kayoko Fujimura, Osaka, JP;
Masato Okano, Osaka, JP;
Yukinobu Nishio, Osaka, JP;
Tomohito Kuwagaito, Osaka, JP;
NALUX CO., LTD., Osaka-shi, Osaka, JP;
Abstract
A microlens array includes N microlenses arranged in a predetermined direction on an x-y plane. A projection onto the x-y plane of the vertex of each microlens is arranged in the vicinity of a lattice point of a reference lattice on the x-y plane, the lattice spacing of the reference lattice in the predetermined direction being D/M (millimeters) where M is a positive integer. A distance between two sides of a lens facing each other is approximately equal to D, and a distance between the projection onto the x-y plane of the vertex of the lens and the projection onto the x-y plane of a side of the lens is D/2+εi. Letting n represent the refractive index of the material of each microlens and letting f (millimeters) represent the focal length of each microlens, the following relationships are satisfied.