The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Jun. 15, 2017
Shimadzu Corporation, Kyoto, JP;
Koichi Tanabe, Uji, JP;
Shingo Furui, Nara, JP;
Hiroyuki Kishihara, Kizugawa, JP;
Kenji Kimura, Yamatokoriyama, JP;
Taro Shirai, Kyoto, JP;
Takahiro Doki, Kyotanabe, JP;
Satoshi Sano, Uji, JP;
Akira Horiba, Uji, JP;
Shimadzu Corporation, Nakagyo-ku, Kyoto-shi, Kyoto, JP;
Abstract
An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.