The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Oct. 30, 2015
Hewlett-packard Development Company, L.p., Houston, TX (US);
Alberto Borrego Lebrato, Sant Cugat del Valles, ES;
Francisco Javier Roses Conesa, Sant Cugat del Valles, ES;
Tanausu Ramirez, Sant Cugat del Valles, ES;
Isidoro Maya, Sant Cugat del Valles, ES;
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
A method of determining calibration values for a media advance system of a page wide array printing device is described. A test pattern is printed on a calibration medium which advances along a media axis through the printing device. The test pattern comprises a plurality of test marks. The test pattern is scanned along a scan axis using a sensor and the calibration medium is advanced along the media axis through the printing device. The dimensions of the scanned test marks are analyzed, and calibration values are determined from the analyzed dimensions of the test marks. The scan axis is orthogonal to the media axis.