The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Mar. 29, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Sang Jine Park, Suwon-si, KR;

Yong Sun Ko, Suwon-si, KR;

In Seak Hwang, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/033 (2006.01); H01L 21/28 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 21/3213 (2006.01); H01L 21/8234 (2006.01); H01L 27/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28114 (2013.01); H01L 21/0337 (2013.01); H01L 21/28123 (2013.01); H01L 21/28132 (2013.01); H01L 21/32139 (2013.01); H01L 21/823431 (2013.01); H01L 29/4238 (2013.01); H01L 29/42376 (2013.01); H01L 29/66795 (2013.01); H01L 29/7856 (2013.01); H01L 27/0207 (2013.01);
Abstract

A method of fabricating semiconductor devices includes sequentially forming a gate layer and a mandrel layer on a substrate, forming a first photoresist on the mandrel layer, forming a mandrel pattern by at least partially removing the mandrel layer using the first photoresist as a mask, forming a spacer pattern that comprises a first mandrel spacer located on a side of a first mandrel included in the mandrel pattern and a second mandrel spacer located on the other side of the first mandrel, forming a sacrificial layer that covers the first and second mandrel spacers after removing the mandrel pattern, forming a second photoresist including a bridge pattern overlapping parts of the first and second mandrel spacers on the sacrificial layer; and forming a gate pattern by at least partially removing the gate layer using the first and second mandrel spacers and the second photoresist as a mask.


Find Patent Forward Citations

Loading…