The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Jun. 30, 2017
Applicant:
Infineon Technologies Ag, Neubiberg, DE;
Inventor:
Thorsten Bucksch, Munich, DE;
Assignee:
Infineon Technologies AG, Neubiberg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/38 (2006.01); G11C 29/36 (2006.01); G11C 29/04 (2006.01); G11C 29/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 29/36 (2013.01); G11C 2029/0401 (2013.01); G11C 2029/2602 (2013.01); G11C 2029/3602 (2013.01);
Abstract
Devices, systems and methods are provided which comprise testing of a non-volatile memory concurrently during at least a part of a testing of other system parts by a processor. In some examples, a device includes a processor, a non-volatile memory, a test controller, and at least one further circuit part. In a test mode, the processor is configured to test the at least one further circuit part, and wherein the test controller is configured to test the non-volatile memory concurrently with at least part of the testing of the at least one further circuit part.