The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Aug. 18, 2014
Applicant:
Spinlabel Technologies, Inc., Boca Raton, FL (US);
Inventor:
Stephen Marcus Key, Glenbrook, NV (US);
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
B65D 23/14 (2006.01); G09F 3/00 (2006.01); G09F 3/02 (2006.01); G09F 3/04 (2006.01);
U.S. Cl.
CPC ...
G09F 3/0288 (2013.01); B65D 23/14 (2013.01); G09F 3/02 (2013.01); G09F 3/04 (2013.01); B65D 2203/12 (2013.01); G09F 2003/021 (2013.01); G09F 2003/0208 (2013.01); G09F 2003/0213 (2013.01); G09F 2003/0216 (2013.01); G09F 2003/0219 (2013.01); G09F 2003/0251 (2013.01); G09F 2003/0272 (2013.01); G09F 2003/0273 (2013.01); Y10T 29/49826 (2015.01);
Abstract
The present application is directed to a rotating shrink label measurement systems for a container and methods thereof. A base label may be adhered to the container, and measurement information displayed on the base label. A top label may cover at least a portion of the base label. The top label may be rotatable about the base label to a specific unit of measurement. The top label may have a transparent window allowing measurement information for the specific unit of measurement to be visible through the transparent window. The container and top label may be enclosed by a tamper evident sleeve.