The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Sep. 05, 2017
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Patrick J. Czarnota, Milpitas, CA (US);
Paul Argus Parks, Los Altos, CA (US);
Nile A. Light, Livermore, CA (US);
Stephen P. Bathurst, Lafayette, CA (US);
John H. Higginson, Santa Clara, CA (US);
Stephen R. Deming, Mountain View, CA (US);
Robert B. Martin, Sunnyvale, CA (US);
Tsan Y. Chan, Santa Clara, CA (US);
Andreas Bibl, Los Altos, CA (US);
Assignee:
Apple Inc., Cupertino, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06T 2207/30148 (2013.01);
Abstract
An optical verification method and mass transfer system described. In an embodiments, a mass transfer sequence may be accompanied by optical imaging and inspection to detect pick and place errors. The optical imaging and inspection techniques may be performed in-situ.