The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Sep. 28, 2018
Accenture Global Solutions Limited, Dublin, IE;
Anurag Dwarakanath, Bangalore, IN;
Sanjay Podder, Thane, IN;
Neville Dubash, Mumbai, IN;
Kishore P Durg, Bangalore, IN;
Manish Ahuja, US Nagar, IN;
Raghotham M Rao, Bangalore, IN;
Samarth Sikand, Rajasthan, IN;
Jagadeesh Chandra Bose Rantham Prabhakara, Chittoor, IN;
Accenture Global Solutions Limited, Dublin, IE;
Abstract
A device may receive, from a user device, a request to verify a machine learning (ML) application using a metamorphic testing procedure. The device may determine a type of ML process used by the ML application, and may select one or more metamorphic relations (MRs), to be used for performing the metamorphic testing procedure, based on the type of ML process. The device may receive test data to be used to test the ML application, wherein the test data is based on the one or more MRs, and may perform, by using the one or more MRs and the test data, the metamorphic testing procedure to verify one or more aspects of the ML application. The device may generate a report that indicates whether the one or more aspects of the ML application have been verified and may provide the report for display on an interface of the user device.