The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Mar. 03, 2016
Applicants:
Shengyin Fan, Beijing, CN;
Zhongwei Cheng, Beijing, CN;
Xin Wang, Beijing, CN;
Qian Wang, Beijing, CN;
Gang Qiao, Beijing, CN;
Inventors:
Shengyin Fan, Beijing, CN;
Zhongwei Cheng, Beijing, CN;
Xin Wang, Beijing, CN;
Qian Wang, Beijing, CN;
Gang Qiao, Beijing, CN;
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00771 (2013.01); G06K 9/4671 (2013.01); G06K 9/6223 (2013.01); G06K 2209/40 (2013.01);
Abstract
A method and an apparatus for detecting an abnormal situation are disclosed. The method includes detecting whether a first target exists in an obtained image; recognizing whether the first target holds an object, when the first target exists in the image; obtaining motion information of the object, when the first target holds the object; and determining, based on the motion information of the object, whether the abnormal situation exists.