The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Feb. 08, 2016
Bank of America Corporation, Charlotte, NC (US);
Kerry M. Cantley, Fort Mill, SC (US);
Shawn Cart Gunsolley, Charlotte, NC (US);
Erin Cassell, Charlotte, NC (US);
Jeffrey R. Goertz, Liberty, MO (US);
Geoffrey Reed Williams, Midlothian, TX (US);
Deborah A. Copes, Wethersfield, CT (US);
Carl Parziale, Charlotte, NC (US);
Emily Brooke Gillespie, Charlotte, NC (US);
David Jacob Feezor, Charlotte, NC (US);
BANK OF AMERICA CORPORATION, Charlotte, NC (US);
Abstract
Embodiments of the invention include systems, methods, and computer-program products for a feedback loop for enhancing archive validation and retention parameter determination for documents. The system may generate or receive image documents. Utilizing image quality and data storage metrics the system may trigger the purging and/or retention of documents in image and/or paper form. Upon retention, the system may continually monitor the documents and store metadata associated with the use of the retained documents. Once the documents are purged, the system compiles historic data points associated with the image quality and data storage metrics. Furthermore, the system extracts the metadata associated with the monitoring of retained documents. These data points and metadata are reviewed to provide revisions in retention parameters for specific documents. A feedback loop directly communicates and integrates the revisions to the metric and criteria for instant integration.