The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Apr. 29, 2016
Trifacta Inc., San Francisco, CA (US);
Adam Eli Silberstein, Sunnyvale, CA (US);
Edward Eli Marschner, San Francisco, CA (US);
Sean Philip Kandel, San Francisco, CA (US);
Philip John Vander Broek, San Francisco, CA (US);
Alon Shulim Bartur, San Francisco, CA (US);
Wei Zheng, San Carlos, CA (US);
Trifacta Inc., San Francisco, CA (US);
Abstract
A system determines samples of datasets that are typically processed by big data analysis systems. The samples are for use for development and testing of transformations for preprocessing the datasets in preparation for analysis by big data systems. The system receives one or more transform operations input datasets for the transform operations. The system determines samples associated with the transform operations. According to a sampling strategy, the system determines samples that return at least a threshold number of records in the result set obtained by applying a transformation. According to another sampling strategy, the system receives criteria describing the result of the transform operations and determines sample sets that generate result sets satisfying the criteria as a result of applying the transform operations.