The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Mar. 13, 2016
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Yaron De-Levie, Kfar Yehoshua, IL;
Ori Mendelson, Tel Aviv, IL;
Idan Peretz, Tel Aviv, IL;
Sagi Hilleli, Rishon Letzion, IL;
Guy Eisenkot, Tel Aviv, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
A computerized system for recursively detecting anomalies in monitored behavior of entities. The system comprises a storage unit to store monitored events, event deviations and parameters related to each event and to each event deviation. The system comprises a processing unit configured to receive a plurality of input events, construct a plurality of baseline models, receive an input event that occurred during an analyzed timeframe, compare parameters of the received input event to a corresponding baseline model in order to detect an event deviation, and associate an event deviation score to the detected event deviation. Using the detected event deviation as an input event, said operations are repeated until a predetermined condition is satisfied, and an alert is generated, indicating suspicious activity has been detected. A viewer application configured to receive and display alerts relating to the detected event deviation is provided.