The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Dec. 12, 2018
Applicant:

Arch Systems, Inc., Mountain View, CA (US);

Inventors:

Christopher Ling, Mountain View, CA (US);

Luke Michael Ekkizogloy, Mountain View, CA (US);

Timothy Matthew Burke, Mountain View, CA (US);

Assignee:

Arch Systems Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 9/455 (2018.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 9/45533 (2013.01); G06F 11/3055 (2013.01); G06F 11/3058 (2013.01); G06F 2009/45591 (2013.01); G06F 2009/45595 (2013.01);
Abstract

A machine monitoring method preferably includes receiving packets, such as packets supplied to a physical machine, virtually simulating physical machine operation, and analyzing the virtual outputs of the virtual simulation. Virtually simulating physical machine operation is preferably performed based on the received packets, such as using a digital duplicate of the physical machine. Analyzing the virtual outputs can include, for example, determining simulated states of one or more aspects, such as physical components, of the physical machine, and/or determining that one or more events associated with physical machine operation have occurred. The method can optionally include, for example, transmitting the analysis results to a remote device, determining the digital duplicate of the physical machine, determining an analysis model for the virtual outputs of the digital duplicate, determining digital component modules, and/or determining digital analysis modules.


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