The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Nov. 27, 2017
Infosys Limited, Bangalore, IN;
Sudipto Shankar Dasgupta, Bangalore, IN;
Swaminathan Natarajan, Bangalore, IN;
Arulkumar Gopalan, Namakkal, IN;
Infosys Limited, Bangalore, IN;
Abstract
A method and system support dynamic impact analysis of at least one change to at least one functional component of a computer application comprising tracking a historical record of the at least one change, grouping a release dataset and a build dataset for matching with at least one requirement from a requirement data file, generating a plurality of impact records datasets () and identifying a nature of change. Further, a plurality of build specific data sets () can be generated based on a text corpus () related to the at least one change and classifying at least one description based on the nature of change. Further an impact matrix () is generated for predicting a potential impact to the at least one test case based on the at least one of a probability of change or a probability of failure.