The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Mar. 04, 2013
Applicant:

Illinois Tool Works Inc., Glenview, IL (US);

Inventors:

Anthony Kehoe, Glenview, IL (US);

Berwin Banares, Glenview, IL (US);

Chris Ellec, Glenview, IL (US);

John Lull, Glenview, IL (US);

William Valentine, Glenview, IL (US);

Assignee:

ILLINOIS TOOL WORKS INC., Glenview, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 7/06 (2006.01); G01F 25/00 (2006.01); G01F 1/684 (2006.01); G01F 1/86 (2006.01); G01F 15/00 (2006.01);
U.S. Cl.
CPC ...
G05D 7/06 (2013.01); G01F 1/6847 (2013.01); G01F 1/86 (2013.01); G01F 15/005 (2013.01); G01F 25/00 (2013.01); G01F 25/0007 (2013.01); G01F 25/0053 (2013.01); G05D 7/0635 (2013.01); Y10T 137/0324 (2015.04); Y10T 137/7722 (2015.04);
Abstract

The disclosed embodiments include a method, apparatus, and computer program product for improving the accuracy of a rate of decay measurement for real time correction in a mass flow controller or mass flow meter by using a thermal model to minimize thermally induced error in the rate of decay measurement.


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