The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Dec. 03, 2014
Applicant:

Hexagon Technology Center Gmbh, Heerbrugg, CH;

Inventors:

Bo Pettersson, London, GB;

Knut Siercks, Mörschwil, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/401 (2006.01); G01S 17/42 (2006.01); G06F 17/50 (2006.01); H04L 29/08 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G05B 19/401 (2013.01); G01B 21/04 (2013.01); G01S 17/42 (2013.01); G06F 17/50 (2013.01); H04L 67/10 (2013.01); Y02P 90/265 (2015.11);
Abstract

Some embodiments described herein relate to a measuring system for automated measurement of an object and detection of differences between features of the object and CAD data of the object. The measuring system may include a measuring device having a distance meter for measuring a position of at least one remote target point, a local computer terminal that is connected to or part of the measuring system, an assigned memory unit for storing the data base comprising the CAD data and an assigned set of measurement software program for controlling the measuring system. In some embodiments, the stored CAD data of the object comprise typical dimensions and tolerances of the features of the object and the assigned set of measurement software programs for controlling the measuring system comprises an optimization algorithm for the measurement of each feature.


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