The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Oct. 08, 2013
General Electric Company, Schenectady, NY (US);
John Brandon Laflen, Niskayuna, NY (US);
Anand Uday, Ann Arbor, MI (US);
Piyush Modi, San Ramon, CA (US);
Joe William Bolinger, Dublin, CA (US);
LynnAnn DeRose, Gloversville, NY (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
A computer-implemented system includes a plurality of metrological interface devices. Each metrological interface device is in communication with a metrological sensing device configured to detect metrological data from a physical asset. The computer-implemented system also includes a portable computing device. The portable computing device is configured to a) receive a metrological data set, the metrological data set substantially representing data associated with the physical asset at a point in time, b) process the metrological data set and an asset data model into a processed metrological data set, c) upon determining, based on the processed metrological data set, a metrological variance, recalibrating the asset data model and returning to step (a), and d) upon determining no metrological variance, reporting the metrological data set and the asset data model to at least one report recipient.