The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Feb. 20, 2015
Max-planck-gesellschaft Zur Foerderung Der Wissenschaften E.v., Munich, DE;
Abstract
The invention is directed to a method for creating an optical tomogram, which comprises the steps providing an optical microscope, arranging a sample () in the optical coverage region of a lens () of the microscope, setting the focus of the lens to a particular focal plane (), recording an image of the sample through the microscope, rotating the sample through an angle α, optionally displacing the sample along the longitudinal axis (z) of the lens () and/or perpendicular to the plane of the previously recorded image () and continuing the method with step d) until a predetermined number of section images () of the sample () have been recorded, wherein the sample () is displaced along the longitudinal axis (z) of the lens () and/or perpendicular to the plane of the previously recorded image (), in accordance with step f), at least once during a rotation of the sample through 360°. Furthermore the invention is directed to an optical microscope for creating tomograms, which comprises at least one lens (), at least one sample suspension device () and at least one illumination device (), wherein the sample suspension device () is rotatable about an axis () arranged perpendicular to the longitudinal axis (z) of the lens () and is displaceable along the longitudinal axis (z) of the lens ().