The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Sep. 27, 2018
Applicant:
Arkray, Inc., Kyoto-shi, Kyoto, JP;
Inventors:
Shinya Nakajima, Kyoto, JP;
Shigeki Masuda, Kyoto, JP;
Kenji Nakanishi, Kyoto, JP;
Yukio Watanabe, Kyoto, JP;
Assignee:
ARKRAY, Inc., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/18 (2006.01); G02B 21/06 (2006.01); G01N 33/493 (2006.01); G01N 21/05 (2006.01); G01N 15/14 (2006.01); G01N 21/17 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01N 15/147 (2013.01); G01N 15/1434 (2013.01); G01N 21/05 (2013.01); G01N 33/493 (2013.01); G02B 21/06 (2013.01); G02B 21/18 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1445 (2013.01); G01N 2021/052 (2013.01); G01N 2021/1772 (2013.01);
Abstract
A plurality of images of a sample are simultaneously captured at different focal lengths by a plurality of cameras. An analysis apparatus includes: a branch section configured to cause light passing through the sample containing a material component to branch off into a plurality of optical paths; a plurality of imaging devices for simultaneously capturing images of the sample in a flow path at different focal points by using the light caused to branch off into the plurality of optical paths; and a controller configured to process the captured images.