The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Jun. 04, 2019
Beihang University, Beijing, CN;
Zhipeng Wang, Beijing, CN;
Yanbo Zhu, Beijing, CN;
Zhen Gao, Beijing, CN;
Jisi Fang, Beijing, CN;
Jingtian Du, Beijing, CN;
BEIHANG UNIVERSITY, Beijing, CN;
Abstract
The present disclosure provides a method for ARAIM fault detection based on extraction of characteristic value of pseudo-range measurement, comprising: calculating a sum of integrity risks of each of fault modes and a maximum value of the integrity risks of each of the fault modes, calculating a quantity of the fault modes by using a ratio of the sum of integrity risks of each of fault modes to an integrity risk of a largest fault, and using a sample quantity of corresponding pseudo-range measurement values as an effective sample quantity; using a ratio of a time duration T to the effective sample quantity as an effective sampling duration; sampling samples of pseudo-range measurement values that are gathered by a receiver within the effective sampling duration, to obtain an effective pseudo-range measurement set; and by using the effective pseudo-range measurement set, calculating a test statistic, and performing integrity fault detection.