The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Jun. 12, 2018
Applicant:

Eumetron Gmbh, Aalen, DE;

Inventor:

Theo Hageney, Aalen, DE;

Assignee:

eumetron GmbH, Aalen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/42 (2006.01); G01C 3/12 (2006.01); G01B 11/26 (2006.01); G01B 11/27 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01S 17/42 (2013.01); G01B 11/002 (2013.01); G01B 11/26 (2013.01); G01B 11/272 (2013.01); G01C 3/12 (2013.01);
Abstract

The present invention relates to a measurement systemcomprising an angle measuring unithaving at least one sensor, a reflective elementopposite to the angle measuring unit, at least one first light sourcearranged on the side of the angle measuring unitand at least one second light source' arranged on the side of the reflective element. The at least one first light sourceis designed to emit light via the reflective elementto the at least one sensor. The at least one second light source is designed to emit light to the at least one sensor. The angle measuring unitis designed to determine at least one angle of incidence βof the light of each first light sourceon the at least one sensorand at least one angle of incidence α, α′ of the light of each second light source′ on the at least one sensorand to calculate positioning information of the reflective elementfrom the determined angles of incidence β, α, α′. The present invention also relates to a corresponding measuring method.


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Hageney, Theo. (2019). System and method for positioning measurement (U.S. Patent No. 10436905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10436905

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