The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Nov. 15, 2016
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Philip Diegmann, Munich, DE;

Jens Naumann, Chemnitz, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/14 (2006.01); G01R 1/20 (2006.01); G01R 13/02 (2006.01); G01R 27/08 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 27/14 (2013.01); G01R 1/203 (2013.01); G01R 13/0218 (2013.01); G01R 27/08 (2013.01); G01R 31/2844 (2013.01);
Abstract

A measurement device for measuring the impedance of a device under test is described. Said measurement device comprises at least one signal generator for generating a signal with a certain frequency wherein said signal is used for testing said device under test. Said measurement device further has at least one shunt resistor that is used for determining the electric current of said signal. Said device also comprise at least two voltage channels for measuring the voltage across said device under test. Said measurement device is an oscilloscope having at least four voltage inputs and wherein said measurement device is configured to derive the impedance of said device from said electric current and said voltage. Further, a method for measuring the impedance of a device under test is described.


Find Patent Forward Citations

Loading…