The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Mar. 10, 2017
Applicant:

Advanced Sensor Technology Limited, Road Town, Tortola, VG;

Inventor:

Hans Ulrich Meyer, Morges, CH;

Assignee:

HEMY8 SA, Morges, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 27/22 (2006.01); G06F 3/044 (2006.01); G06F 3/041 (2006.01); G06K 9/00 (2006.01); G06F 3/0354 (2013.01);
U.S. Cl.
CPC ...
G01N 27/226 (2013.01); G01R 27/2605 (2013.01); G06F 3/03547 (2013.01); G06F 3/044 (2013.01); G06F 3/0416 (2013.01); G06K 9/0002 (2013.01); G06F 2203/04104 (2013.01); G06F 2203/04107 (2013.01); G06F 2203/04111 (2013.01);
Abstract

A capacitive imaging method or device using an array of row electrodesand column electrodeson a substrate, wherein cross-capacitance between row and column electrodes is obtained from row electrodeself-capacitance measured with the remaining electrodes grounded, column electrodeself-capacitance measured with the remaining electrodes grounded, and combined row and column electrode self-capacitance measured with the remaining electrodes grounded. A preferred embodiment is a hand-held wall scanner for detecting hidden features having a two-dimensional display the size of the array and located over it. Hidden features influencing row-to-column cross-capacitances are thus imaged in real size and at their real location.


Find Patent Forward Citations

Loading…