The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Apr. 01, 2014
Applicant:

President and Fellows of Harvard College, Cambridge, MA (US);

Inventors:

Peter Christian Maurer, Boston, MA (US);

Hyun Ji Noh, Boston, MA (US);

Georg Kucsko, Cambridge, MA (US);

Mikhail D. Lukin, Cambridge, MA (US);

Hongkun Park, Lexington, MA (US);

Minako Kubo, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 11/20 (2006.01); G01K 7/32 (2006.01); G01K 13/00 (2006.01);
U.S. Cl.
CPC ...
G01K 7/32 (2013.01); G01K 11/20 (2013.01); G01K 13/00 (2013.01); G01K 2211/00 (2013.01);
Abstract

An approach to nanoscale thermometry that utilizes coherent manipulation of the electronic spin associated with nitrogen-vacancy (NV) color centers in diamond is disclosed. The methods and apparatus allow for detection of temperature variations down to milli-Kelvin resolution, at nanometer length scales. This biologically compatible approach to thermometry offers superior temperature sensitivity and reproducibility with a reduced measurement time. The disclosed apparatus can be used to study heat-generating intracellular processes.


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