The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Nov. 07, 2017
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Makoto Fujino, Nagano, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); B41J 2/21 (2006.01); G01J 3/52 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
G01J 3/462 (2013.01); B41J 2/2103 (2013.01); G01J 3/52 (2013.01); H04N 1/6033 (2013.01); G01J 2003/466 (2013.01); H04N 1/6008 (2013.01); H04N 1/6011 (2013.01);
Abstract
An inspection apparatus includes a colorimetric value acquisition unit that acquires a colorimetric value of a patch positioned on a color chart, a decision unit that decides an approval status of the colorimetric value of the patch, on a basis of the colorimetric value of the patch and a reference value prepared for the patch, and a display processing unit that displays, on a display unit, a chart image simulating the color chart, and in which a color representing a patch image positioned in the chart image is displayed in a shape representing a decision result made by the decision unit.