The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

May. 16, 2016
Applicant:

Diramed, Llc, Columbus, OH (US);

Inventors:

Richard J. Higgins, Westerville, OH (US);

Brian Lipp, Columbus, OH (US);

Don Warren Caudy, Sunbury, OH (US);

Assignee:

DIRAMED, LLC, Columbus, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/44 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0297 (2013.01); G01J 3/0232 (2013.01); G01J 3/28 (2013.01); G01J 3/44 (2013.01); G01N 21/274 (2013.01);
Abstract

Described are a shutter assembly, a spectrometer, and a method for calibrating a spectrometer. For example, the method may include positioning a shutter including a mirror into a first position in an illumination path of an excitation light beam such that a measurement window is blocked. The mirror may be operable to direct at least one of: (1) the illumination path to a spectral calibration material, (2) a first collection path extending from the spectral calibration material, and (3) a second collection path of a spectral calibration light beam. The method may include directing a returned light from the receiving optics unit to an imaging device; processing the returned light at the imaging device into one or more image signals; analyzing and comparing the image signals with approved image signals; and providing an indication of whether the comparative results of the analysis are within acceptable tolerances.


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