The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Jun. 01, 2018
Central Iron and Steel Research Institute, Beijing, CN;
Guang Feng, Beijing, CN;
Yunhai Jia, Beijing, CN;
Haizhou Wang, Beijing, CN;
Zhongnan Bi, Beijing, CN;
Xuejing Shen, Beijing, CN;
Peng Wang, Beijing, CN;
Hailong Qin, Beijing, CN;
Lei Zhao, Beijing, CN;
Xing Yu, Beijing, CN;
Dongling Li, Beijing, CN;
CENTRAL IRON AND STEEL RESEARCH INSTITUTE, Beijing, CN;
Abstract
The invention relates to a full-field statistical & characterizing method of fluid micro-explored strain for alloy microstructure, comprising the following steps: a. grinding and polishing the surface of an alloy sample to mirror with no grinding defects, and then determining a to-be-measured area on the surface of the alloy sample; b. utilizing a white light interferometry 3D surface profiler to perform initial morphology measurement on the surface of an alloy sample; c. utilizing an isostatic pressing technology to obtain the microstructure deformation on the surface of the alloy sample, and then utilizing a white light interferometry 3D surface profiler to perform deformed morphology measurement on the surface of the alloy sample to obtain a changing spectrum of micro morphology of the microstructures on the surface of the alloy; and d. performing trans-scale and rapid quantitative statistical distribution characterization on the morphology change before and after isostatic pressing of the microstructures in the to-be-measured area of the alloy, so as to obtain a corresponding full-field metallography. In the present invention, the sample pretreatment is simple, the analysis speed is rapid, the scanning area is large, and the requirement of high throughput trans-scale analysis can be satisfied, so as to instruct the extraction of the material metallography feature unit.