The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Dec. 08, 2016
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Tilman Schmoll, Dublin, CA (US);
Matthew J. Everett, Livermore, CA (US);
Nathan Shemonski, San Mateo, CA (US);
CARL ZEISS MEDITEC, INC., Dublin, CA (US);
CARL ZEISS MEDITEC AG, Jena, DE;
Abstract
Various balanced detection systems which reduce alignment requirements of free space optics based balanced detection configurations are discussed. One example system includes a light source, a beam divider, sample optics, return optics, and a processor. The light source generates a light beam. The beam divider separates the light beam into reference and sample arms. The sample optics deliver the light beam in the sample arm to a light scattering object to be imaged. The return optics direct light to a balanced detection system, which has a balanced detection beam divider for combining light scattered from the object and light from the reference arm and directing the combined light into two detection channels and two detectors for collecting the combined light in the two detection channels and generating signals in response thereto. The processor processes the signals and generates image data of the object based on the processed signals.