The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
Dec. 11, 2015
The Boeing Company, Chicago, IL (US);
Brenda C. Gross, Tacoma, WA (US);
John W. Dorsey-Palmateer, Daniel Island, SC (US);
The Boeing Company, Chicago, IL (US);
Abstract
Systems and methods for using metrology to assist a user at a workstation to form a part into a desired contour include scanning the part to obtain scanned data indicative of an actual contour of the part. Distance errors are determined based on a comparison of the scanned data to a computer model of the desired contour. A contour map of deviation is determined based on the distance errors, with the contour map of deviation indicating magnitudes of the distance errors for at least a selected set of points on the actual contour of the part. Visible indicium is projected onto the part that represents the contour map of deviation, thereby assisting the user of the workstation to identify where further modification of the actual contour is needed.