The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Mar. 24, 2017
Applicant:

Airbus Operations Gmbh, Hamburg, DE;

Inventors:

Peter Klose, Hamburg, DE;

Frank Leuenberger, Hamburg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A62B 25/00 (2006.01); A62B 7/14 (2006.01); A62B 18/02 (2006.01); B65D 43/26 (2006.01); G05B 15/02 (2006.01); A62B 27/00 (2006.01); B64D 11/00 (2006.01); G01R 31/00 (2006.01); B64F 5/60 (2017.01);
U.S. Cl.
CPC ...
A62B 25/005 (2013.01); A62B 7/14 (2013.01); A62B 18/02 (2013.01); A62B 27/00 (2013.01); B64D 11/00 (2013.01); B64F 5/60 (2017.01); B65D 43/26 (2013.01); G01R 31/008 (2013.01); G05B 15/02 (2013.01); B64D 2231/02 (2013.01); B64D 2231/025 (2013.01);
Abstract

An oxygen supply system includes a container housing having a container door, a latch controller coupled to a latch of the container door and configured to control the latch to releasably open the container door, a microcontroller coupled to the latch controller and configured to output a first latch deployment signal to the latch controller to cause the latch controller to open the latch, a pressure sensor coupled to the latch controller and configured to output a second latch deployment signal to the latch controller to cause the latch controller to open the latch, and an energy storage coupled to the microcontroller and the pressure sensor and configured to supply the microcontroller and the pressure sensor with electrical energy. The microcontroller includes built-in test equipment (BITE) configured to monitor and test the operability of one or more of the microcontroller, the latch controller, the pressure sensor and the energy storage.


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