The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2019

Filed:

Aug. 13, 2014
Applicant:

Carl Zeiss Vision Gmbh, Aalen, DE;

Inventors:

Timo Kratzer, Aalen, DE;

Jesus-Miguel Cabeza-Guillen, Aalen, DE;

Gerhard Kelch, Aalen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/11 (2006.01); A61B 3/113 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/111 (2013.01); A61B 3/113 (2013.01); A61B 3/1005 (2013.01);
Abstract

The invention relates to a method and an apparatus for determining the location of at least two optical parameters of an eye of a test person. In the method, at least two optical parameters of an eye having a reference structure are photographically recorded to determine in each case one of the optical parameters of the eye. The apparatus for determining at least two optical parameters of an eye having a reference structure is provided with separate recording units for photographically recording the eye for the determination of in each case one of the optical parameters of the eye.


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