The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Aug. 07, 2018
Olympus Corporation, Tokyo, JP;
Yohei Sakamoto, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A reliability determination unit determines a measurement reliability on the basis of a point on a first parallax image. An imaging condition determination unit determines whether imaging conditions of an imaging unit have changed after the reliability determination unit determines that the measurement reliability is low. The imaging unit captures an image of an object which is a measurement target and generates a second parallax image after the reliability determination unit determines that the measurement reliability is low. The reliability determination unit determines the measurement reliability on the basis of a point on the second parallax image after the imaging condition determination unit determines that the imaging conditions have changed.