The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Jun. 12, 2018
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Nathan Wayne Chapman, Middleton, ID (US);

Swarnal Borthakur, Boise, ID (US);

Marc Allen Sulfridge, Boise, ID (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/3745 (2011.01); H04N 5/232 (2006.01); H01L 27/146 (2006.01); H01L 25/16 (2006.01);
U.S. Cl.
CPC ...
H04N 5/37452 (2013.01); H01L 25/167 (2013.01); H01L 27/14609 (2013.01); H04N 5/23229 (2013.01);
Abstract

Global shutter imaging pixels may include a charge storage region that receives charge from a respective photodiode. Global shutter imaging pixels may be formed as frontside illuminated imaging pixels or backside illuminated imaging pixels. Shielding charge storage regions from incident light may be important for image sensor performance. To shield charge storage regions in backside illuminated global shutter imaging pixels, shielding structures may be included over the charge storage region. The shielding structures may include backside trench isolation structures, a metal layer formed in a backside trench between backside trench isolation structures, and frontside deep trench isolation structures. The metal layer may have angled portions that reflect light towards the photodiodes.


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