The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Aug. 31, 2017
Applicant:

Universite DE Bretagne Sud, Lorient, FR;

Inventors:

Emmanuel Boutillon, Lorient, FR;

Ahmed Abdmouleh, Brest, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/11 (2006.01); H03M 13/00 (2006.01); H03M 13/25 (2006.01); H03M 13/35 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1171 (2013.01); H03M 13/255 (2013.01); H03M 13/353 (2013.01); H03M 13/616 (2013.01); H03M 13/116 (2013.01); H04L 1/0041 (2013.01); H04L 1/0045 (2013.01);
Abstract

At least a method and an apparatus are presented for determining a coded modulation scheme, the coded modulation scheme being defined by at least one non-binary error correcting code containing at least one non-binary parity-check equation, a modulation scheme, and a modulation mapping. Two or more candidate modulation mappings and two or more candidate parity-check equations are determined defining the at least one non-binary error correcting code, a candidate set comprising a candidate modulation mapping and at least one candidate parity-check equation providing codeword vectors and being associated with one or more metrics, each metric being evaluated for a number of distinct pairs of codeword vectors having an Euclidean distance of a defined value. One candidate modulation mapping and at least one candidate parity-check equation are selected according to an optimization criterion applied to the one or more metrics.


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