The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Jul. 01, 2015
Smiths Heimann Gmbh, Wiesbaden, DE;
Thomas Brudy, Eltville, DE;
Susanne Kruppa, Frankfurt am Main, DE;
SMITHS HEIMANN GMBH, Wiesbaden, DE;
Abstract
The present disclosure relates to a device and method for generating test X-ray images for nondestructively inspecting an inspection object, such as a piece of luggage or a package. The generation device includes: an inspection object database for storing X-ray image data of inspection objects generated using at least one X-ray inspection facility; a target item database containing image data of target items; and an image projection unit for projecting a virtual image of a target item from the target item database into an X-ray image from the inspection object database to generate a test X-ray image. The image projection unit is configured for generating test images based on an X-ray image of an inspection object, the X-ray image having been recorded prior to a first time period, and the associated inspection object having already been classified as safe and/or having been classified as safe during an automatic inspection.