The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Oct. 20, 2011
Joerg Bredno, San Francisco, CA (US);
Eberhard Sebastian Hansis, Menlo Park, CA (US);
David Sowards-emmerd, San Jose, CA (US);
Joerg Bredno, San Francisco, CA (US);
Eberhard Sebastian Hansis, Menlo Park, CA (US);
David Sowards-Emmerd, San Jose, CA (US);
KONINKLIKE PHILIPS N.V., Eindhoven, NL;
Abstract
A method includes displaying at least one of projection data or reconstructed image data having visually observable artifacts, wherein the at least one of the projection data or the reconstructed image data corresponds to an imaging examination of an object or subject and displaying, concurrently with the at least one of the projection data or the reconstructed image data, sample images with known artifacts. The method further includes identifying one or more of the sample images having artifacts similar to the visually observable artifacts in the at least one of the projection data or the reconstructed image data. The method further includes displaying information about the identified one or more of the sample images, wherein the information includes information related to mitigating the visually observable artifacts.