The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Aug. 31, 2017
The Regents of the University of California, Oakland, CA (US);
Erwin Frise, Oakland, CA (US);
Benjamin Booth, San Lorenzo, CA (US);
Charles McParland, Berkeley, CA (US);
Keith Beattie, Oakland, CA (US);
Bill Fisher, Berkeley, CA (US);
Ann S. Hammonds, Berkeley, CA (US);
Susan E. Celniker, Lafayette, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Disclosed herein are systems methods for high content screening for microscope imaging. In some embodiments, the system comprises: a microscope; and a processor configured to implement: a slide loader module; a reference imager module; a slide imager module; a region of interest (ROI) finder module; a compare imager module; a calibrator module; and an image stitcher module.