The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Nov. 23, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Anat Parush Tzur, Beer-Sheva, IL;

Arik Sapojnik, Beer-Sheva, IL;

Nimrod Milo, Gedera, IL;

Assaf Natanzon, Tel Aviv, IL;

Nir Goldschmidt, Hertzliya, IL;

Otniel Van-Handel, Modiin Elite, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2013.01);
Abstract

An apparatus comprises a plurality of storage tiers, at least one data mover module, and skew predictor. A model generator processes information characterizing input-output activity involving one or more of the storage tiers in order to obtain skew measurements indicating portions of the input-output activity directed to portions of the one or more storage tiers for respective periods of time less than at least one corresponding time granularity, and generates a predictive model from the skew measurements. The skew predictor is configured in accordance with the predictive model to convert additional skew measurements obtained for a given period of time less than a desired time granularity to corresponding skew measurements in the desired time granularity. One or more of the converted skew measurements are utilized by the data mover module in controlling transfer of data between the storage tiers. The model generator is part of a machine learning system.


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