The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

May. 06, 2016
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Eng Lim Goh, Serangoon, SG;

Patrick Donlin, Deephaven, MN (US);

Andrew Warner, Edina, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/20 (2006.01); G06F 11/07 (2006.01); G06F 11/00 (2006.01); G06F 1/324 (2019.01);
U.S. Cl.
CPC ...
G06F 1/206 (2013.01); G06F 11/00 (2013.01); G06F 11/0793 (2013.01); G06F 1/324 (2013.01); Y02D 10/126 (2018.01);
Abstract

An apparatus and method thermally manage a high performance computing system having a plurality of nodes with microprocessors. To that end, the apparatus and method monitor the temperature of at least one of a) the environment of the high performance computing system and b) at least a portion of the high performance computing system. In response, the apparatus and method control the processing speed of at least one of the microprocessors on at least one of the plurality of nodes as a function of at least one of the monitored temperatures.


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