The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Jul. 12, 2016
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Hideaki Nishiuchi, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0256 (2013.01); Y02P 90/02 (2015.11); Y02P 90/18 (2015.11);
Abstract

A monitoring and diagnosis system reduces a load at the time of collecting operation state information of a plant apparatus and is inexpensive. A plant includes a plant apparatus, a local control device that controls the plant apparatus on the basis of operation state information of the plant apparatus from a sensor, and a high-order control system that is connected to the local control device and controls the operation of the entire plant. A monitoring subsystem performs failure diagnosis in accordance with a failure diagnosis algorithm which is set in advance, on the basis of the operation state information acquired from the local control device. A monitoring and diagnosis system collects results of the failure diagnosis performed by the monitoring subsystem and pieces of operation state information of the plant apparatus which are consolidated by the monitoring subsystem.


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